Search for improved surface treatment procedures in fabrication of HgI2 x-ray spectrometers
- 15 July 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 213 (1) , 35-38
- https://doi.org/10.1016/0167-5087(83)90039-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Reduction of Polarization in Mercuric Iodide Nuclear Radiation DetectorsIEEE Transactions on Nuclear Science, 1980
- State-of-the-art of crystal growth and nuclear spectroscopic evaluation of mercuric iodide radiation detectorsNuclear Instruments and Methods, 1978
- Fabrication of HgI2 nuclear detectorsNuclear Instruments and Methods, 1977
- Vapor growth of HgI2 by periodic source or crystal temperature oscillationJournal of Crystal Growth, 1976
- Charge Carrier Transport Properties of Semiconductor Materials Suitable for Nuclear Radiation DetectorsIEEE Transactions on Nuclear Science, 1975
- Gamma Ray Efficiency Comparisons for Si(Li), Ge, CdTe and HgI2 DetectorsIEEE Transactions on Nuclear Science, 1973
- Crystal structures of the red, yellow, and orange forms of mercuric iodideInorganic Chemistry, 1967