A cost-effective method for minimizing the sphere-of-confusion error of x-ray microdiffractometers
- 1 February 1999
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 70 (2) , 1300-1304
- https://doi.org/10.1063/1.1149588
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Characterization of substrate/thin-film interfaces with x-ray microdiffractionApplied Physics Letters, 1998
- Residual stress/strain analysis in thin films by X-ray diffractionCritical Reviews in Solid State and Materials Sciences, 1995
- Strain Measurements and Laue Diffraction with MicrobeamsMRS Proceedings, 1994
- Development of an Innovative 5 µm φ Focused X-Ray Beam Energy-Dispersive Spectrometer and its ApplicationsJapanese Journal of Applied Physics, 1988
- Small Area X-Ray Diffraction Techniques; Applications of the Micro-Diffractometer to Phase Identification and Strain DeterminationPublished by Springer Nature ,1984