Effects of Heat Treatment on Lead Telluride under Tellurium Pressure:–Carrier Concentration Dependence of Mobility and Etch Pits on Worked Surfaces–

Abstract
Single crystals of lead telluride having carrier concentrations from 8×1016to 6×1017/c.c. forn-type and from 1017to 6×1018/c.c. forp-type have been obtained with controlling tellurium pressure. Hall mobility of carriers depends on carrier concentration and has a maximum as a function of carrier concentration. Etch pits on crystal surfaces have been observed. Their density is 7×106/cm2before annealing and decreases to 4×106/cm2after annealing.

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