Materials characterization with the acoustic microscope
- 28 March 1994
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (13) , 1632-1634
- https://doi.org/10.1063/1.111836
Abstract
The material signature of the acoustic microscope in reflection is calculated taking into account exactly aberration and phase shifts caused by different sound path lengths. The results allow to evaluate elastic material properties from the distance between an interference maximum and the maximum from specular reflection of measured V(z) curves. This is necessary if rigid materials such as ceramics are investigated because in these cases high frequency acoustic microscopes yield V(z) curves with only one maximum besides that from specular reflection.Keywords
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