2. An uhv system for in situ preparation and analysis of thin films and surfaces
- 31 December 1978
- Vol. 28 (12) , 523-526
- https://doi.org/10.1016/0042-207x(78)90003-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- Epitaxial growth of metal single-crystal filmsVacuum, 1974
- Auger electron spectroscopySurface Science, 1971
- Scanning Electron Diffraction of Film GrowthJournal of Vacuum Science and Technology, 1966