Elimination of latch up in bulk CMOS

• 1 January 1980
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 248-251
• https://doi.org/10.1109/iedm.1980.189806

Abstract

Keywords

• LATCHES
• CMOS TECHNOLOGY
• THYRISTORS
• SUBSTRATES
• SEMICONDUCTOR DEVICE MEASUREMENT
• MICROPROCESSORS
• CIRCUITS
• CHARGE CARRIER LIFETIME
• PACKAGING
• GOLD