STUDY OF DISLOCATIONS IN LIGHTLY DEFORMED COPPER CRYSTALS USING BORRMANN X-RAY TOPOGRAPHY
- 1 February 1967
- journal article
- Published by Canadian Science Publishing in Canadian Journal of Physics
- Vol. 45 (2) , 757-763
- https://doi.org/10.1139/p67-057
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- A Camera for Borrmann Stereo X-Ray TopographsPublished by Springer Nature ,1966
- Growth of Copper Crystals of Low Dislocation DensityJournal of Applied Physics, 1964
- The initiation of plastic flow in copperActa Metallurgica, 1964
- Dislocation density and flow stress of copperActa Metallurgica, 1962
- Elongated dislocation loops and the stress-strain properties of copper single crystalsPhilosophical Magazine, 1962
- Elastic-Plastic Transition in Copper Crystals as Determined by an Etch-Pit TechniqueJournal of Applied Physics, 1961
- Etch Pits at Dislocations in CopperJournal of Applied Physics, 1960