Field ion microscopy investigations of grain boundary topography

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Abstract
The study of grain boundary topography involves the handling of large volumes of data and therefore computer methods have been developed to aid in the rapid and accurate analysis of these data and in the plotting of the three-dimensional representation of the boundary surfaces. Points along the boundary traces are digitized and transformed into three-dimensional specimen space assuming stereographic projection and hemispherical tip. The boundary surfaces can be plotted by one of two methods—orthogonal cross-sectional contour method or tip-contour method. To obtain more information about the topography, the grain boundary surface is divided into a large number of small sections, and the Miller indices of these sections are determined and plotted on a sterographic pole plot.

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