Characterization of Porous Thin Films Using Quartz Crystal Shear Resonators
- 21 April 2000
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 16 (11) , 5064-5071
- https://doi.org/10.1021/la991145q
Abstract
No abstract availableKeywords
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