Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopy

This publication has 14 references indexed in Scilit:

• Extended dislocations in germanium
  Philosophical Magazine, 1973
• APPLICATIONS AND RECENT DEVELOPMENTS IN TRANSMISSION ELECTRON MICROSCOPY
  Published by University of California Press ,1972
• Measurement of the stacking-fault energy of gold using the weak-beam technique of electron microscopy
  Philosophical Magazine, 1972
• The critical voltage effect in high voltage electron microscopy
  Philosophical Magazine, 1972
• The weak beam technique as applied to the determination of the stacking-fault energy of copper
  Philosophical Magazine, 1971
• The observation of dissociated dislocations in silicon
  Philosophical Magazine, 1970
• Investigations of dislocation strain fields using weak beams
  Philosophical Magazine, 1969
• Approximations of the dynamical theory of diffraction contrast
  Philosophical Magazine, 1968
• The Computer Generation of Electron Microscope Pictures of Dislocations
  Australian Journal of Physics, 1967
• Electron Microscopic Images of Single and Intersecting Stacking Faults in Thick Foils. Part I: Single Faults
  Physica Status Solidi (b), 1963