Long-term testing of 68 kbit bubble device chips
- 1 November 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 12 (6) , 680-682
- https://doi.org/10.1109/tmag.1976.1059143
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Giant negative magnetoresistance in granular ferromagnetic systems (invited)Journal of Applied Physics, 1993
- Preparation and Properties of Magnetic Garnet Films Containing Divalent and Tetravalent IonsJournal of the Electrochemical Society, 1976
- Spontaneous annihilations in magnetic bubble propagationJournal of Applied Physics, 1975
- Diagnostic testing of a 10-kbit bubble memory chipIEEE Transactions on Magnetics, 1975
- Lifetime characterization of propagated bubble-data streamsApplied Physics Letters, 1973