Scanning electron microscopy (S.E.M.) of biopsy specimens of ruptured intracranial saccular aneurysms
- 1 January 1978
- journal article
- research article
- Published by Springer Nature in Acta Neuropathologica
- Vol. 44 (2) , 131-134
- https://doi.org/10.1007/bf00691478
Abstract
Surgical specimens of 4 intracranial saccular aneurysms were studied by scanning electron microscopy. The internal surface of the aneurysms showed crater-like defects and cytoplasmic bridges. In some areas the endothelium was preserved, but its longitudinal convolutions were higher and thicker than those found in unchanged areas. On the damaged endothelial surface there was an increased number of blood cells. The adventitia resembled that of a normal cerebral artery. In conclusion the alterations observed are similar to those found in atherosclerosis and are most likely dut to the high wear and tear provoked by the blood streaming into the aneurysm. The results of this study are in agreement with the findings of a companion transmission electron microscopy study and emphasize the importance of degenerative changes on the development and rupture of intracranial saccular aneurysms.Keywords
This publication has 5 references indexed in Scilit:
- Histological and ultrastructural study of intracranial saccular aneurysmal wallActa Neurochirurgica, 1978
- Ultrastructure of AneurysmsArchives of Neurology, 1975
- Scanning electron microscopy of saccular intracranial aneurysms.1972
- Electron Microscopy of Human Cerebral AneurysmsJournal of Neurosurgery, 1965
- Development of Intracranial Aneurysms as Revealed by Electron MicroscopyJournal of Neurosurgery, 1963