Theory of channel hot-carrier degradation in MOSFETs

• 1 December 1999
• journal article
• Published by Elsevier in Physica B: Condensed Matter
• Vol. 272  (1-4) , 527-531
• https://doi.org/10.1016/s0921-4526(99)00363-4

Abstract

Keywords

• TRANSISTOR LIFETIME
• HOT-CARRIER DEGRADATION
• HYDROGEN/DEUTERIUM ISOTOPE EFFECT