New Time-of-Flight Mass Spectrometer

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Abstract
A time‐of‐flight mass spectrometer based on principles previously described has been constructed with two major modifications to facilitate appearance potential measurements. These modifications are (1) an axial electron beam is pulsed through an ionization chamber utilizing techniques of Fox, et al., and (2) a gated ion detector is employed to allow for integration of the resolved ion current from successive cycles. The instrument has been constructed of stainless steel to allow for measurements on chemically active gases. Theoretical resolution, limited by thermal energies of the ions, appears to be well over mass 200. Preliminary experimental work has verified this up to the region of mass 100. Ionization potentials, using the difference method, have been obtained from various gases that are in agreement with the spectroscopic data to within 0.05 volts.

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