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Characterization of LPCVD Aluminum for VLSI Processing
Home
Publications
Characterization of LPCVD Aluminum for VLSI Processing
Characterization of LPCVD Aluminum for VLSI Processing
RL
R. A. Levy
R. A. Levy
MG
M. L. Green
M. L. Green
PG
P. K. Gallagher
P. K. Gallagher
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1 September 1984
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 131
(9)
,
2175-2182
https://doi.org/10.1149/1.2116043
Abstract
No abstract available
Cited
Cited by 79 articles
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