Atomic Structure and Properties of Extended Defects in Silicon

• 1 April 1999
• journal article
• Published by Trans Tech Publications, Ltd. in Solid State Phenomena
• Vol. 67-68, 3-14
• https://doi.org/10.4028/www.scientific.net/ssp.67-68.3

Abstract

Keywords

• DISLOCATION
• ELECTRONIC STRUCTURE
• GRAIN BOUNDARY
• TEM
• Z-CONTRAST