Application of shearography to quality assurance
- 1 May 1995
- journal article
- Published by Elsevier in Journal of Materials Processing Technology
- Vol. 52 (1) , 141-150
- https://doi.org/10.1016/0924-0136(94)01435-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Simple spatial filtering for shearogramsOptics & Laser Technology, 1989
- Phase-shifting speckle interferometryApplied Optics, 1985
- Shearography: A New Optical Method For Strain Measurement And Nondestructive TestingOptical Engineering, 1982