Thickness measurements of adsorbed layers by auger electron spectroscopy
- 1 August 1975
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 17 (3) , 373-375
- https://doi.org/10.1016/0038-1098(75)90314-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Oxidation studies of amorphous and crystalline germanium films by Auger spectroscopyApplied Physics Letters, 1974
- The adsorption of oxygen on silicon (111) surfaces. IISurface Science, 1974
- The application of electron spectroscopy to surface studiesJournal of Vacuum Science and Technology, 1974
- Quantitative Auger electron spectroscopy and electron rangesSurface Science, 1972
- Auger Electron Spectroscopy Studies of Sputter Deposition and Sputter Removal of Mo from Various Metal SurfacesJournal of Applied Physics, 1972
- Auger Electron Spectroscopy of fcc Metal SurfacesJournal of Applied Physics, 1968