Measurement of the principal refractive indices of thin films deposited at oblique incidence
- 1 October 1985
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 2 (10) , 1693-1697
- https://doi.org/10.1364/josaa.2.001693
Abstract
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This publication has 10 references indexed in Scilit:
- Thin-films field-transfer matrix theory of planar multilayer waveguides and reflection from prism-loaded waveguidesJournal of the Optical Society of America A, 1984
- 4 × 4 Matrix formalisms for optics in stratified anisotropic mediaJournal of the Optical Society of America A, 1984
- Beam reflection from lossy dielectric layersJournal of the Optical Society of America, 1983
- A Comparison of Thin Film Measurement by Guided Waves, Ellipsometry and ReflectometryOptica Acta: International Journal of Optics, 1981
- Electromagnetic propagation in birefringent layered mediaJournal of the Optical Society of America, 1979
- Columnar microstructure in vapor-deposited thin filmsThin Solid Films, 1977
- Optics in Stratified and Anisotropic Media: 4×4-Matrix FormulationJournal of the Optical Society of America, 1972
- Refraction in Stratified, Anisotropic Media*Journal of the Optical Society of America, 1970
- Electromagnetic Wave Propagation in Birefringent Multilayers*Journal of the Optical Society of America, 1966
- The Structure of Evaporated Metal Films and Their Optical PropertiesJournal of the Optical Society of America, 1950