STM atomic-scale characterization of the γ′-Al2O3 film on Ni3Al(111)
- 1 December 1999
- journal article
- Published by Elsevier in Surface Science
- Vol. 442 (3) , 385-399
- https://doi.org/10.1016/s0039-6028(99)00951-6
Abstract
No abstract availableKeywords
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