Quantitative depth profile analysis by glow discharge
- 30 April 1994
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 49 (4) , 411-429
- https://doi.org/10.1016/0584-8547(94)80034-0
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Radio frequency powered glow discharge atomization/ionization source for solids mass spectrometryAnalytical Chemistry, 1989
- Quantitative depth profiling by glow discharge mass spectrometrySurface and Interface Analysis, 1988
- A contribution to the solution of the problem of quantification in surface analysis work using glow discharge atomic emission spectroscopySpectrochimica Acta Part B: Atomic Spectroscopy, 1985
- Versuche zur quantitativen Tiefenprofilanalyse von Stahloberflächen durch Emissionsspektrometrie mit der GlimmlampeMicrochimica Acta, 1983
- Surface analysis by glow dischargeSurface and Interface Analysis, 1981
- L'analyse des surfaces métalliques par spectrométrie d'émission à décharge luminescenteSpectrochimica Acta Part B: Atomic Spectroscopy, 1978
- Glow-discharge optical spectroscopy for the analysis of thin filmsJournal of Applied Physics, 1973
- In-Depth Compositional Profile Analysis of Alloys Using Optical Emission Glow Discharge SpectrographyApplied Spectroscopy, 1973
- Sputtering in a glow discharge for spectrochemical analysisAnalytical Chemistry, 1972
- Eine neue glimmentladungslampe für die optische emissionsspektralanalyseSpectrochimica Acta Part B: Atomic Spectroscopy, 1968