Test patterns for EPROMs
- 1 August 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 14 (4) , 730-734
- https://doi.org/10.1109/jssc.1979.1051251
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Operation and characterization of N-channel EPROM cellsSolid-State Electronics, 1978
- An erase model in double poly-Si gate n-channel FAMOS devicesIEEE Transactions on Electron Devices, 1978
- Famos—A new semiconductor charge storage deviceSolid-State Electronics, 1974