A high speed signal averager for electron beam test systems

• 1 January 1987
• journal article
• Published by Elsevier in Microelectronic Engineering
• Vol. 7  (2-4) , 201-207
• https://doi.org/10.1016/s0167-9317(87)80012-6

Abstract

Keywords

• SIGNAL PROCESSING
• DIGITAL
• VOLTAGE
• ELECTRON BEAM
• TEST SYSTEMS
• AVERAGER