Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments
Open Access
- 1 January 1988
- journal article
- research article
- Published by Hindawi Limited in Active and Passive Electronic Components
- Vol. 13 (1) , 1-6
- https://doi.org/10.1155/1988/54096
Abstract
Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.Keywords
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