Characterization of Ill-V heterostructures grown by selective-area epitaxy using double-crystal X-ray diffractometry with high lateral resolution
- 14 April 1995
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 28 (4A) , A172-A178
- https://doi.org/10.1088/0022-3727/28/4a/034
Abstract
No abstract availableKeywords
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