Surface-Thin Film Analysis by Ultrasoft X-Ray Fluorescence Spectroscopy
- 1 January 1984
- journal article
- research article
- Published by Taylor & Francis in Spectroscopy Letters
- Vol. 17 (1) , 55-62
- https://doi.org/10.1080/00387018408068044
Abstract
The use of x-ray fluorescence spectroscopy (XFS) using hard x-rays (λ 3A.Keywords
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