Fault diagnosis based on post-test fault dictionary generation
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A practical approach to fault diagnosis based on posttest fault dictionary generation is presented. Computer resources which are needed to generate a fault dictionary can be reduced drastically by utilizing the error symptoms obtained from go/no-go test execution. The approach has been applied to several circuits, and the results are very promising.Keywords
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