Measuring Electrostatic Double-Layer Forces at High Surface Potentials with the Atomic Force Microscope
- 1 January 1996
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 100 (41) , 16700-16705
- https://doi.org/10.1021/jp961549g
Abstract
No abstract availableKeywords
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