Reliability and Failure Mechanisms of Electronic Materials

• 1 August 1978
• journal article
• Published by Annual Reviews in Annual Review of Materials Science
• Vol. 8  (1) , 459-495
• https://doi.org/10.1146/annurev.ms.08.080178.002331

Abstract

Keywords

• RELIABILITY ANALYSIS
• ELECTROMIGRATION
• MATERIALS SCIENCE
• INTEGRATED CIRCUIT
• FAILURE MODE