SF−6 production via excimer-mediated electron attachment to mixed rare gas/SF6 clusters
- 17 August 1992
- journal article
- research article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 116 (3) , 273-280
- https://doi.org/10.1016/0168-1176(92)80045-3
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Autoscavenging of electrons in mixed van der Waals clusters: a new approach to the spectroscopy of cluster anionsThe Journal of Physical Chemistry, 1992
- The observation of unusual resonance channels in the electron attachment to mixed argon-oxygen clustersChemical Physics Letters, 1992
- Free electron attachment to van der Waals clustersInternational Journal of Mass Spectrometry and Ion Processes, 1991
- On the nature of bulk and surface excitations in Argon clustersThe European Physical Journal D, 1991
- Electron capture induced processes in molecules and molecular aggregatesInternational Journal of Mass Spectrometry and Ion Processes, 1990
- Excited-state dynamics of rare-gas clustersThe Journal of Chemical Physics, 1988
- Cluster ions: Production, detection and stabilityInternational Journal of Mass Spectrometry and Ion Processes, 1987
- Ionization of clusters in collision with high-Rydberg rare gas atomsThe Journal of Physical Chemistry, 1987
- Vibrational predissociation induced by exciton trapping in inert-gas clustersChemical Physics Letters, 1986
- Self-scavenging of electrons in van der waals molecules of methyl iodideChemical Physics Letters, 1980