Comparisons of Single Event Vulnerability of GaAs SRAMS
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (6) , 1590-1596
- https://doi.org/10.1109/TNS.1986.4334647
Abstract
A GaAs MESFET/JFET model incorporated into SPICE has been used to accurately describe C-EJFET, E/D MESFET and D MESFET/resistor GaAs memory technologies. These cells have been evaluated for critical charges due to gate-to-drain and drain-to-source charge collection. Low gate-to-drain critical charges limit conventional GaAs SRAM soft error rates to approximately 1E-6 errors/bit-day. SEU hardening approaches including decoupling resistors, diodes, and FETs have been investigated. Results predict GaAs RAM cell critical charges can be increased to over 0.1pC. Soft error rates in such hardened memories may approach 1E-7 errors/bit-day without significantly reducing memory speed. Tradeoffs between hardening level, performance and fabrication complexity are discussed.Keywords
This publication has 9 references indexed in Scilit:
- A large-signal GaAs MESFET model implemented on SPICEIEEE Circuits and Devices Magazine, 1985
- A Study of Single Events in GaAs SRAMsIEEE Transactions on Nuclear Science, 1985
- Gate Charge Collection and Induced Drain Current in GaAs FETsIEEE Transactions on Nuclear Science, 1985
- Characteristics of SEU Current Transients and Collected Charge in GaAs and Si DevicesIEEE Transactions on Nuclear Science, 1985
- Charge Collection in Ga/Aa Test StructuresIEEE Transactions on Nuclear Science, 1984
- SEU of Complementary GaAs Static Rams Due to Heavy IonsIEEE Transactions on Nuclear Science, 1984
- Charge Collection Measurements on GaAs Devices Fabricated on Semi-Insulating SubstratesIEEE Transactions on Nuclear Science, 1984
- Suggested Single Event Upset Figure of MeritIEEE Transactions on Nuclear Science, 1983
- Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMsIEEE Transactions on Nuclear Science, 1982