Contact resistance of carbon nanotubes
- 12 April 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 74 (15) , 2122-2124
- https://doi.org/10.1063/1.123776
Abstract
Electrical contacts to carbon nanotubes typically exhibit high resistance, posing a serious obstacle to their application in electronic devices. One important factor may be their unique electronic structure, which gives weak electronic coupling at the Fermi surface. This suggests some possible ways to reduce contact resistance.Keywords
This publication has 8 references indexed in Scilit:
- Single- and multi-wall carbon nanotube field-effect transistorsApplied Physics Letters, 1998
- Universal Density of States for Carbon NanotubesPhysical Review Letters, 1998
- Contacting carbon nanotubes selectively with low-ohmic contacts for four-probe electric measurementsApplied Physics Letters, 1998
- Carbon Nanotube Quantum ResistorsScience, 1998
- Room-temperature transistor based on a single carbon nanotubeNature, 1998
- Pure Carbon Nanoscale Devices: Nanotube HeterojunctionsPhysical Review Letters, 1996
- Anomalous Corrugations in Scanning Tunneling Microscopy: Imaging of Individual StatesPhysical Review Letters, 1986
- Nonlifetime effects in photoemission linewidthsPhysical Review B, 1983