Characterization of [001] tilt boundaries in bicrystalline thin films of copper
- 16 April 1980
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 58 (2) , 333-341
- https://doi.org/10.1002/pssa.2210580202
Abstract
No abstract availableKeywords
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