Predicting Failure Stress of Silicon Nitride Ceramics Using Microfocus Radiography
- 1 November 1988
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 71 (11) , C460-C461
- https://doi.org/10.1111/j.1151-2916.1988.tb07548.x
Abstract
Microfocus projection radiography was used to evaluate nondestructively a large quantity of silicon nitride modulus‐of‐rupture test bars. Quantitative data (size, shape, and location) on major naturally occurring voids in rejected bars were determined from radiographs. Failure stress prediction was attempted using a fracture mechanics model and nondestructive evaluation data and compared to actual failure stress.Keywords
This publication has 5 references indexed in Scilit:
- Improving the Reliability of Silicon Nitride: A Case StudyAdvanced Ceramic Materials, 1988
- Assessment of Flaws in Ceramic Materials on the Basis of Non-Destructive EvaluationPublished by Springer Nature ,1986
- Sintering Microstructure and Properties of Si3N4 and SiC Based Structural CeramicsPublished by ASME International ,1981
- Effects of Microstructure on the Mechanical Properties of CeramicsPublished by Springer Nature ,1974
- The strength of ceramicsMaterials Science and Engineering, 1970