A microinterferometric method for analysis of rotation‐symmetric refractive‐index gradients in intact objects
- 1 October 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 132 (1) , 21-29
- https://doi.org/10.1111/j.1365-2818.1983.tb04705.x
Abstract
No abstract availableKeywords
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