Polarity determination of single-crystal epitaxial layers by x-ray diffraction
- 1 November 1989
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 66 (9) , 4198-4200
- https://doi.org/10.1063/1.343983
Abstract
The anomalous scattering of x rays has been used to determine the polarity of single‐crystal epitaxial layers, as grown on the substrate material. The method relies on the breakdown of Friedel’s law in noncentrosymmetric structures and is particularly effective when there exists a large difference between the values of the imaginary anomalous dispersion correction, f‘, for the respective atomic species. The method is nondestructive and measurements are taken from only one side of the sample (the side with the epitaxial layer).This publication has 13 references indexed in Scilit:
- Polarity determination in compound semiconductors by channeling: Application to heteroepitaxyApplied Physics Letters, 1988
- Anharmonic thermal vibrations and the position parameter in wurtzite structures. II. Cadmium selenideActa crystallographica Section B, Structural science, crystal engineering and materials, 1984
- Crystallographic polarity and etching of cadmium tellurideJournal of Applied Physics, 1983
- Wavelength-dependent measurements of extinction in an extended-face crystal of zinc selenideActa Crystallographica Section A Foundations of Crystallography, 1983
- A simple method for the determination of structure-factor phase relationships and crystal polarity using electron diffractionJournal of Applied Crystallography, 1982
- Crystallographic polarity and chemical etching of CdxHg1−xTeJournal of Applied Physics, 1981
- Anharmonic temperature factors of zinc selenide determined by X-ray diffraction from an extended-face crystalActa Crystallographica Section A, 1980
- Polarity determination by diffraction from planes inclined to an extended crystal faceJournal of Applied Crystallography, 1971
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968
- Crystallographic Polarity in the II-VI CompoundsJournal of Applied Physics, 1962