Structural characterization of organic monolayers on Si〈111〉 from capacitance measurements
- 1 June 2000
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 45 (20) , 3241-3248
- https://doi.org/10.1016/s0013-4686(00)00428-x
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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