The Electrical Properties of La2−xSrxNiO4 (0≤x≤1)
- 1 March 1986
- journal article
- research article
- Published by Oxford University Press (OUP) in Bulletin of the Chemical Society of Japan
- Vol. 59 (3) , 703-706
- https://doi.org/10.1246/bcsj.59.703
Abstract
The electrical resistivities and Seebeck coefficients of mixed oxides, La2−xSrxNiO4, have been determined under an He atmosphere at 77.4–673.2 K. It has been shown that the temperature dependences of the Seebeck coefficients of the oxides were fairly well approximated by this equation: S=AT+B+C⁄T, where T is the thermodynamic temperature. The coefficients of the equation, A, B, and C, were given by the least-squares method. The metal-semiconductor ratios {α≡(C⁄T)⁄(AT+C⁄T)} were given to characterize the thermoelectrical properties of La2−xSrxNiO4. The maximal activation energies (Ea(resis.) and Ea(Seebeck)) and the maximal metal-semiconductor ratio (α) were obtained with the strontium concentration of La2−xSrxNiO4 at x=0.5. The lattice distortion of the oxides is responsible for the maxima of the activation energies and of the metal-semiconductor ratio at x=0.5.Keywords
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