WSXM: A software for scanning probe microscopy and a tool for nanotechnology
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- 1 January 2007
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 78 (1) , 013705
- https://doi.org/10.1063/1.2432410
Abstract
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.Keywords
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