In situ x-ray diffraction study of the antiferroelectric–ferroelectric phase transition in PLSnZT
- 20 May 1996
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 68 (21) , 2942-2944
- https://doi.org/10.1063/1.116362
Abstract
In situ x‐ray diffraction studies were performed on the PLSnZT antiferroelectric–ferroelectric phase switching ceramic and polycrystalline powder. The crystallography of both the antiferroelectic and electric‐field‐induced ferroelectric phases were determined for the approximate composition of Pb0.98La0.02(Zr0.55Sn0.33Ti0.12)0.995O3. A preferred antiferroelectric domain structure has been identified and possible mechanisms responsible for the domain structure are presented. A single tetragonal phase has been identified for the room temperature zero‐field antiferroelectric material with unit cell dimensions a=4.107 Å and c=4.081 Å. An electric field‐induced structure developing at the antiferroelectric–ferroelectric switching field has also been observed and determined to be of rhombohedral symmetry with a=4.105 Å and θ=89.85° indicating a volume increase of 0.49% for the tetragonal–rhombohedral transition.Keywords
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