Functional modeling of integrated injection logic—DC analysis
- 1 March 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 24 (3) , 234-241
- https://doi.org/10.1109/t-ed.1977.18714
Abstract
Dc analysis of integrated injection logic structures is performed. The analysis is bared on partitioning the basic I2L structure into injection and n-p-n transistor regions. One-dimensional approximation is assumed in obtaining the intrinsic and the extrinsic βuof the n-p-n transistor. The electric field in the epiregion has been considered and the analysis predicts the behavior of βuat an arbitrary current level. An effective efficiency λ for the injection region is also given. The results of the analysis are compared to practical measurements.Keywords
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