Transmission electron microscopy of thin oxide layers recovered from the surface of metals
- 1 April 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 78 (4) , 349-356
- https://doi.org/10.1016/0040-6090(81)90038-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A simple method for studying surface films on solids using transmission electron microscopyThin Solid Films, 1980
- The Relationship Between Oxide Grain Morphology and Growth Mechanisms for Fe‐Cr‐Al and Fe‐Cr‐Al‐Y AlloysJournal of the Electrochemical Society, 1979
- The oxidation behavior of CoCrAI systems containing active element additionsOxidation of Metals, 1978
- The influence of yttrium additions on the oxide-scale adhesion to an iron-chromium-aluminum alloyOxidation of Metals, 1976