Correction to "Syndrome-Testable Design of Combinational Circuits"

• 1 November 1980
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
• Vol. C-29  (11) , 1012-1013
• https://doi.org/10.1109/tc.1980.1675496

Abstract

Keywords

• COMBINATIONAL CIRCUITS
• SYNDROME-TESTABLE DESIGN