X-ray diffractometry situ of evaporated thin films: application to amorphous tellurium
- 1 August 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 36 (2) , L1-L4
- https://doi.org/10.1016/0040-6090(76)90074-2
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Electron Diffraction Study of the Local Atomic Arrangement in Amorphous Tellurium FilmsPhysica Status Solidi (b), 1973
- An electron diffraction and resistivity study of non-crystalline thin films of gold and silverJournal of Non-Crystalline Solids, 1972
- Adaption d'un ensemble de détection Si(Li) à un diffractometre XJournal of Applied Crystallography, 1972
- Density of the Lunar SurfaceScience, 1968