Node-fault diagnosis and a design of testability
- 1 December 1981
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1037-1042
- https://doi.org/10.1109/cdc.1981.269376
Abstract
A concept of k-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition requires little computation with a few test points in view of the complexity of the problem of multifault diagnosis of large-scale circuits. This condition is further evolved to a necessary and almost sufficient condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability is established.Keywords
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