Transmission ellipsometry of a thin-film helicoidal bianisotropic medium
- 1 September 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (9) , 1180-1182
- https://doi.org/10.1063/1.119618
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Chiral sculptured thin filmsNature, 1996
- Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystalsJournal of the Optical Society of America A, 1996
- On light propagation in helicoidal bianisotropic mediumsProceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences, 1995
- Modal structures for axial wave propagation in a continuously twisted structurally chiral mediumThe Journal of the Acoustical Society of America, 1995
- Influence of pitch on attenuation and handedness of axial propagation modes in helicoidal bianisotropic mediums (Optics Comm. 111 (1994) 199)Optics Communications, 1995
- Influence of pitch on attenuation and handedness of axial propagation modes in helicoidal bianisotropic mediumsOptics Communications, 1994
- Multichannel transmission ellipsometer for characterization of anisotropic optical materialsJournal of the Optical Society of America A, 1994
- Automatic rotating element ellipsometers: Calibration, operation, and real-time applicationsReview of Scientific Instruments, 1990
- Optical properties of thin filmsThin Solid Films, 1982
- Optically Active Fluorite FilmsNature, 1959