X-ray interference in ultrathin epitaxial layers: A versatile method for the structural analysis of single quantum wells and heterointerfaces

This publication has 27 references indexed in Scilit:

• Dynamical diffraction of x rays at grazing angle
  Physical Review B, 1989
• Investigation of nanometer layer heterostructures by X-ray grazing incidence diffraction
  Physica Status Solidi (a), 1988
• Investigation of (Ga,In)(As,P)/InP single heterostructures by means of extremely asymmetrical Bragg diffraction using synchrotron radiation
  Journal of Applied Crystallography, 1988
• Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity
  Journal of Applied Physics, 1988
• Lattice-parameter-difference measurement of heteroepitaxial structures by means of extremely asymmetrical Bragg diffraction
  Journal of Applied Crystallography, 1987
• X-ray diffraction of multilayers and superlattices
  Acta Crystallographica Section A Foundations of Crystallography, 1986
• Improved assessment of structural properties of ${\mathrm{Al}}_{\mathrm{x}}$${\mathrm{Ga}}_{1\mathrm{-}\mathrm{x}}$As/GaAs heterostructures and superlattices by double-crystal x-ray diffraction
  Physical Review B, 1986
• The dynamic theory of X-ray diffraction by the one-dimensional ideal superlattice. I. Diffraction by the arbitrary superlattice
  Acta Crystallographica Section A Foundations of Crystallography, 1985
• X-ray rocking curve analysis of superlattices
  Journal of Applied Physics, 1984
• The interpretation of X-ray rocking curves from III–V semiconductor device structures
  Journal of Crystal Growth, 1984