p-type semiconducting properties in lithium-doped MgO single crystals

Abstract
The phenomenally large enhancement in conductivity observed when Li-doped MgO crystals are oxidized at elevated temperatures was investigated by dc and ac electrical measurements in the temperature interval 250–673 K. The concentration of [Li]0 centers (substitutional Li+ ions each with a trapped hole) resulting from oxidation was monitored by optical absorption measurements. At low electric fields, dc measurements reveal blocking contacts. At high fields, the IV characteristic is similar to that of a diode connected in series with the bulk resistance of the sample. Low-voltage ac measurements show that the equivalent circuit for the sample consists of the bulk resistance in series with the junction capacitance connected in parallel with a capacitance, which represents the dielectric constant of the sample. Both dc and ac experiments provide consistent values for the bulk resistance. The electrical conductivity of oxidized MgO:Li crystals increases linearly with the concentration of [Li]0 centers. The conductivity is thermally activated with an activation energy of (0.70±0.02)eV, which is independent of the [Li]0 content. The standard semiconducting mechanism satisfactorily explains these results. Free holes are the main contribution to band conduction as they are released from the [Li]0-acceptor centers. In as-grown MgO:Li crystals (without [Li]0 centers) the electrical current increases with time as [Li]0 centers are being formed. When ample [Li]0 centers are formed, an activation energy of 0.7 eV was observed. At sufficiently high current, Joule heating thermally destroys the [Li]0 centers.
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