Measurement of symmetrical and anti-symmetrical deformations by hologram interferometry
- 30 June 1974
- journal article
- Published by Elsevier in Optics Communications
- Vol. 11 (2) , 127-131
- https://doi.org/10.1016/0030-4018(74)90199-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Four Exposure Holographic Moiré TechniqueApplied Optics, 1973
- Contours of equal in-plane displacement in holographic interferometryOptics Communications, 1973
- Holographic determination of in-plane deformationOptics Technology, 1970
- Application of Hologram Interferometry to Plate Deformation and Translation MeasurementsOptica Acta: International Journal of Optics, 1969
- Measurement of in-plane surface strain by hologram interferometryJournal of Physics E: Scientific Instruments, 1968
- Surface-Deformation Measurement Using the Wavefront Reconstruction TechniqueApplied Optics, 1966