A Switch from High-Fidelity to Error-Prone DNA Double-Strand Break Repair Underlies Stress-Induced Mutation
Open Access
- 16 September 2005
- journal article
- research article
- Published by Elsevier
- Vol. 19 (6) , 791-804
- https://doi.org/10.1016/j.molcel.2005.07.025
Abstract
No abstract availableKeywords
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